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Katkısız ve Katkılı-Cd0.22Zn0.78S Filmleri X-Işını Kırınım Çalışmaları (Seri C) Sprey Piroliz tarafından Depolar

X-Ray Diffraction Studies of Undoped and in-Doped Cd0.22Zn0.78S Films Deposited by Spray Pyrolysis (series C)

Journal Name:

  • Çankaya University Journal of Arts and Sciences

Publication Year:

  • 2005

Key Words:

Author NameUniversity of AuthorFaculty of Author
Abstract (2. Language): 
Cd0.22Zn0.78S and In-doped Cd0.22Zn0.78S films have been produced by the spray pyrolysis method at 275±5°C substrate temperature. This work describes the X-ray diffraction spectra of all films at room temperature. X-ray diffraction spectra of the films showed that they are hexagonal and formed as Cd0.22Zn0.78S polycrystalline structure. Film thickness, texture coefficient (TC), grain size values, lattice constants, and d% error were calculated. Effects of Indium incorporation on these properties deposited films have been systematically investigated.
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  • 1
85-94
  • Turkish

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