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Sprey döküm nanoyapılı CdS ince filmlerinin bazı fiziksel özellikleri üzerine tavlama sıcaklığının etkisi

The influence of annealing temperature on some physical properties of spray deposited nanostructured CdS thin films

Journal Name:

  • Cumhuriyet Üniversitesi Fen Fakültesi Fen Bilimleri Dergisi

Publication Year:

  • 2015
DOI: 
http://dx.doi.org/10.17776/csj.69365

Key Words:

Keywords (Original Language):

Author NameUniversity of AuthorFaculty of Author
Abstract (2. Language): 
In this study, the effect of annealing temperature on physical properties of CdS thin films was studied. CdS in the form of thin film was prepared by a simple and inexpensive spray pyrolysis technique for various annealing temperatures. After deposition, films were annealed at 400-450-500 °C for 2 hours at air atmosphere. The effects of the annealing temperature on the physical properties of the films were investigated by studying the transmittance measurements, spectroscopic ellipsometry technique, atomic force microscope (AFM) observations and the four probe technique. The transmittance measurements were used to estimate the band gap energy by the linear fit of (h)2 curve. The band gap energy was found to be slightly decreasing with the annealing process. From the four probe measurement the resistivity was determined and found to be strongly decreasing with increasing the annealing temperature. Finally, annealing process and annealing temperature confirmed significant effects on the optical, electrical and surface properties CdS thin films.
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Abstract (Original Language): 
Bu çalışmada, CdS ince filmlerin fiziksel özellikleri üzerine tavlama sıcaklığının etkisi çalışıldı. İnce film formundaki CdS, basit ve pahalı olmayan sprey piroliz yöntemiyle, çeşitli tavlama sıcaklıklarında hazırlandı. Çökelme sonrası, filmler hava atmosferinde 2 saat boyunca 400-450-500 oC’de tavlandı. Geçirgenlik ölçümleri, spektroskopik elipsometre tekniği, atomik kuvvet mikroskobu (AFM) gözlemleri ve dört uç tekniği çalışmalarıyla, filmlerin fiziksel özellikleri üzerine tavlama sıcaklığının etkisi incelendi. Geçirgenldoğrusal fitleme ile, band aralığı tahminlerinde kullanıldı. Band aralık enerjisinin, tavlama süreci ile hafifçe azaldığı bulundu. Dört uç ölçümlerinden, direnç belirlendi ve artan tavlama sıcaklığı ile hızla azaldığı görüldü. Son olarak, tavlama süreci ve tavlama sıcaklığının CdS ince filmlerin optik, elektrik ve yüzey özellikleri üzerinde önemli etkileri doğruladı.
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REFERENCES

References: 

[1] Perna G., Capozzi V., Ambrico M., Augelli V., Ligonzo T., Minafra A., Schiavulli L., Pallara M., Structural and optical characterization of undoped CdS films grown by pulsed laser deposition, Thin Solid Films 2004; 187:453–454.
[2] Ikhmayies S.J., Production and Characterization of CdS/CdTe Thin Film Photovoltaic Solar Cells of Potential Industrial Use, PhD Thesis, University of Jordan, 2002.
The influence of annealing temperature on some physical properties of spray deposited
nanostructured CdS thin films
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[3] Vankar V.D., Das S.R., Nath P., Chopra K.L., Structure of vacuum, evaporated CdxZn1–xS thin films, Phys. Stat. Sol. A 1978; 45:663-665.
[4] S. Vodjani, A. Sharifnai, M. Doroudian, Electron. Lett. 9 (1973) 128.
[5] Sathaye S.D., Sinha A.P.B., Studies on thin films of cadmium sulphide prepared by a chemical deposition method, Thin Solid Films 1976; 37:15-23.
[6] Berry A.K., Amirtharaj P.M., Booney J. L., Martin D. D., Photoluminescence and Raman studies of CdS films grown by metal-organic chemical vapor deposition on Si{111} substrates, Thin Solid Films 1992; 219:153-156.
[7] B.K. Guptam, O.P. Agnihotri, A. Raza, Thin Solid Films 48 (1978) 153.
[8] S.J. Ikhmayies, Production and characterization of CdS/CdTe thin film photovoltaic solar cells of potential industrial use, Ph.D. Thesis, University of Jordan, Amman, Jordan, 2002.
[9] Kityk I.V., Makowska-Janusik M., Ebothe J., ElHichou A., ElIdrissi B., Addou M., Photoinduced non-linear optical effects in the ZnS-Al, In–Sn doped film–glass nanometer-sized interfaces, Appl. Surface Sci. 2002; 202:24-32.
[10] Khoshman J., Kordesch M., Optical characterization of sputtered amorphous aluminum nitride thin films by spectroscopic ellipsometry, J. Non-Cryst. Solids 2005; 351:3334-3340.
[11] Zhao Z., Morel D.L., Ferekides C.S., Electrical and optical properties of tin-doped CdO films deposited by atmospheric metalorganic chemical vapor deposition, Thin Solid Films 2002; 413:203-211.

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