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Conductive Atomic Force Microscopy Analysis of Double Layer Inkjet Printed Electronic Structures (C-AFM)

Journal Name:

  • International Journal of Science and Engineering Investigations

Publication Year:

  • 2017

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Abstract (2. Language): 
The local electrical characteristics of double layer inkjet printed electronic structures were studied with conductive atomic force microscopy (C-AFM). The investigated samples were silver traces produced by inkjet printing of silver Nano ink. The silver traces were covered with different circumferences of silver ink, PEDOT: PSS ink and carbon ink. So, the samples consisted of an underlying silver layer with a conductive layer on it. Additionally, to the conventional topography analysis, the current conduction characteristics of the layers were investigated by mapping the current distribution over the topography with a nanoscale resolution. The results proved that the pass-through of current through a double layer probe of a silver trace, which is coated with a PEDOT: PSS or carbon layer is significantly influenced by the layer thickness of PEDOT: PSS or carbon layer. Nevertheless, the enhancement of the layer thickness does not lead to the same values as pure PEDOT: PSS or pure carbon layer would deliver. So coverage influences the conductivity on a low level but protect the underlying layer in a proper way against mechanical stress.
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  • English