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Termal Buharlaştırma ile Büyütülmüş Polikristal CdInTe İnce Filmlerin Yapısal, Elektriksel ve Optik Özelliklerinin Araştırılması

Investigations on Structural, Electrical and Optical Properties of Polycrystalline CdInTe Thin Films Grown by Thermal Evaporation

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Abstract (2. Language): 
In this study, properties of thermally evaporated polycrystalline CdInTe thin films were investigated. The surface morphology, composition and crystal structure of the films were determined by means of SEM, EDXA and XRD analysis. Temperature dependent Hall effect measurements were carried out in the temperature range of 200-400 K. In the whole temperature region, the dominant transport mechanism of the films was found to be thermionic emission of the carriers over the grain boundaries. The room temperature conductivity, mobility and electron concentration values were found to be 1.8x10-2 cm 2V-1s-1 and 1.1x10-15 cm- , respectively. The mobility-temperature dependence showed that ionized impurity, neutral donor impurity and acoustic phonon scattering mechanisms were effective over the low (216-256 K), intermediate (256-317 K) and high temperature (317-357 K) regions, respectively. The optoelectronic properties of the films were also investigated by absorption in 190-1100 nm wavelength region and photoconductivity measurements in 80-400 K temperature range.
Abstract (Original Language): 
Bu çalışmada, termal buharlaştırma yoluyla üretilmiş polikristal CdInTe ince filmlerin özellikleri araştırılmıştır. Filmlerin yüzey morfolojisi, kompozisyonu ve kristal yapısı SEM, EDXA ve XRD analizleri ile incelenmiştir. Sıcaklığa bağlı Hall etkisi ölçümleri 200-400 K sıcaklık aralığında gerçekleştirilmiştir. Tüm sıcaklık aralığında etkin akım mekanizmasının termoiyonik emisyon olduğu tespit edilmiştir. Oda sıcaklığında iletkenlik, mobilite ve elektron konsantrasyonu sırasıyla 1.8x10-2 iyonize safsızsızlık, nötral verici safsızlığı ve akustik fonon saçılma mekanizmalarının sırasıyla (216-256 K), (256-317 K) ve (317-357 K) sıcaklık aralıklarında etkin olduğu belirlenmiştir. Filmlerin optoelektronik özellikleri 190-1100 nm dalgaboyu aralığında soğurma ve 80-400 K sıcaklık aralığında fotoiletkenlik ölçümleri ile araştırılmıştır.
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