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Structural and Optical Properties of Ge20Se70Zn10 Thin Films

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  • International Journal of Science and Engineering Investigations

Publication Year:

  • 2017

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Abstract (2. Language): 
Thin films having composition Ge20Se70Zn10 were deposited onto glass substrates by the vacuum thermal evaporation technique. Effective crystallite size and strain are determined by the method of variance analysis of the X-ray diffraction line profiles for the films. Reflectance and transmittance at normal incidence of the as-deposited and annealed samples are measured by spectrophotometer in the spectral range of 300 – 2500 nm. Direct optical band gap (Eg) and Urbach energy (EU) are calculated from the absorption coefficient. Analytical relations are used to deduce the real and imaginary refractive indices at each scanned wavelength from the measured reflectance and transmittance. Dispersive parameters of Wemple-DiDomenico dispersion’s relations are also deduced.
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International Journal of Science and Engineering Investigations, Volume 6, Issue 70, November 2017 97
www.IJSEI.com Paper ID: 67017-14
ISSN: 2251-8843
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